SN74BCT8240ADWG4
Texas Instruments
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70
[no prices available]Distributors
Currency:
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70
[no prices available]