24-bit 40kSPS 5-ch delta-sigma ADC with PGA, Vref, and 2x IDACs for factory automation 32-VQFN -40 to 125

10-bit, I2C interface, buffered-voltage-output digital-to-analog converter (DAC) 16-WQFN -40 to 125

10-bit, I2C interface, buffered-voltage-output digital-to-analog converter (DAC) 16-WQFN -40 to 125

Digital to Analog Converters - DAC 8-Bit 2.5-12 us Dual DAC

Analog to Digital Converters - ADC 8-Bit 40kSPS Serial Out Lo-Pwr

Digital to Analog Converters - DAC 8-Bit 10 us Octal DAC Serial Input

DC918C-M: Demo Board for the LTC2201 16-Bit, 20Msps ADC.

The AD5790?is a single 20-bit, voltage out DAC that operates from a bipolar supply up to 33V. Reference buffers are also provided on-chip The AD5790 accepts a positive reference input in the range of 5V to VDD ? 2.5V and a negative reference input in the range of VSS + 2.5v to 0V. The AD5790 offers a relative accuracy of +/-2 LSB's max and operation is guaranteed monotonic with a -1 LSB to +3 LSB's DNL specification.The part uses a versatile 3-wire serial interface that operates at clock rates up to 35 MHz and is compatible with standard SPI?, QSPI?, MICROWIRE?, and DSP interface standards. The part incorporates a power-on reset circuit that ensures the DAC output powers up to 0V and in a known output impedance state and remains in this state until a valid write to the device takes place. The part provides a disable feature that places the output in a defined load state.PRODUCT HIGHLIGHTS 20-bit resolution Wide power supply range of up to ?16.5 V. ?40?C to +125?C operating temperature range. Low 8 nV/?Hz noise. Low ?0.018 ppm/?C gain error temperature coefficient.APPLICATIONS Medical instrumentation Test and measurement Industrial control Scientific and aerospace instrumentation Data acquisition systems Digital gain and offset adjustment Power supply control

The AD7770 is an 8-channel, simultaneous sampling ADC. Eightfull sigma-delta (?-?) ADCs are on chip. The AD7770 providesa low input current to allow direct sensor connection. Each inputchannel has a programmable gain stage allowing gains of 1, 2, 4,and 8 to map lower amplitude sensor outputs into the full-scaleADC input range, maximizing the dynamic range of the signalchain. The AD7770 accepts a VREF voltage from 1 V up to 3.6 V.The analog inputs accept unipolar (0 V to VREF) or true bipolar(?VREF/2) analog input signals with 3.3 V or ?1.65 V analogsupply voltages, respectively for PGAGAIN = 1. The analog inputscan be configured to accept true differential, pseudo differential,or single-ended signals to match different sensor outputconfigurations.Each channel contains a PGA, an ADC modulator and asinc3, low latency digital filter. An SRC is provided to allow fineresolution control over the AD7770 ODR. This control can beused in applications where the ODR resolution is required tomaintain coherency with 0.01 Hz changes in the line frequency.The SRC is programmable through the serial port interface (SPI).The AD7770 implements two different interfaces: a data outputinterface and SPI control interface. The ADC data output interfaceis dedicated to transmitting the ADC conversion results fromthe AD7770 to the processor. The SPI writes to and reads fromthe AD7770 configuration registers and for the control andreading of data from the SAR ADC. The SPI can also beconfigured to output the ?-? conversion data.The AD7770 includes a 12-bit SAR ADC. This ADC can beused for AD7770 diagnostics without having to decommissionone of the ?-? ADC channels dedicated to system measurementfunctions. With the use of an external multiplexer, which can becontrolled through the three general-purpose input/output pins(GPIOs), and signal conditioning, the SAR ADC can validatethe ?-? ADC measurements in applications where functionalsafety is required. In addition, the AD7770 SAR ADC includesan internal multiplexer to sense internal nodes.The AD7770 contains a 2.5 V reference and reference buffer. Thereference has a typical temperature coefficient of 10 ppm/?C.The AD7770 offers two modes of operation: high resolution modeand low power mode. High resolution mode provides a higherdynamic range while consuming 10.75 mW per channel; lowpower mode consumes just 3.37 mW per channel at a reduceddynamic range specification.The specified operating temperature range is ?40?C to +105?C,although the device is operational up to +125?C.Applications Protection relays General-purpose data acquisition Industrial process control

The ADATE324 is a complete, single-chip, quad-channel automatic test equipment (ATE) solution that performs the pin electronics (PE) functions of a driver, a comparator, and an active load (DCL). The device also features a high voltage (VHH) drive capability per chip to support flash memory testing applications. Dedicated 16-bit digital-to-analog converters (DACs) with on-chip calibration registers provide all the necessary dc levels for operation of the device.The voltage driver features three active states: high, low, and terminate mode, as well as a high impedance inhibit state. The inhibit state, in conjunction with the integrated dynamic clamps, facilitates significant attenuation of transmission line reflections when the driver is not actively terminating the line. The open circuit drive capability is ?1.5 V to +4.5 V to accommodate the standard range of ATE and instrumentation applications.The ADATE324 can be used as a quad, single-ended, pin electronics channel or as a dual differential channel. In additional to per channel, high speed window comparators, the ADATE324 provides two programmable threshold differential comparators for differential ATE applications.All dc levels for DCL functions are generated by dedicated on-chip 16-bit DACs. To facilitate accurate programming levels, the ADATE324 also includes an integrated calibration function to correct for gain and offset errors of each functional block. Correction coefficients can be stored on chip, and any values written to the DACs are automatically adjusted using the appropriate correction factors.The ADATE324 uses a serial programmable interface (SPI) bus to program all functional blocks, DACs, and on-chip calibration constants. The device also has an on-chip temperature sensor, and overvoltage and undervoltage fault clamps, for monitoring and reporting the device temperature, and any output pin voltage faults that may occur during operation.For more information on the ADATE324, contact ADATE324@analog.com.APPLICATIONS ATE Semiconductor and board test systems Instrumentation and characterization equipment